Service
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=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
Code: Alles auswählen
smartctl version 5.33 [i386-pc-mingw32] Copyright (C) 2002-4 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: IC35L040AVER07-0
Serial Number: SXPTXTQT614
Firmware Version: ER4OA46A
User Capacity: 41,174,138,880 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 5
ATA Standard is: ATA/ATAPI-5 T13 1321D revision 1
Local Time is: Fri Nov 19 17:00:49 2004 Westeuropäische Normalzeit
==> WARNING: IBM Deskstar 60GXP drives may need upgraded SMART firmware.
Please see http://www.geocities.com/dtla_update/index.html#rel and
http://www-3.ibm.com/pc/support/site.wss/document.do?lndocid=MIGR-42215 or
http://www-1.ibm.com/support/docview.wss?uid=psg1MIGR-42215
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (1383) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 23) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 060 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 100 100 024 Pre-fail Always - 221 (Average 218)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 1468
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 5
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 12774
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 774
192 Power-Off_Retract_Count 0x0032 099 099 050 Old_age Always - 1468
193 Load_Cycle_Count 0x0012 099 099 050 Old_age Always - 1468
194 Temperature_Celsius 0x0002 148 148 000 Old_age Always - 37 (Lifetime Min/Max 10/58)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 5
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 43
SMART Error Log Version: 1
ATA Error Count: 512 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 512 occurred at disk power-on lifetime: 12748 hours (531 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 e0 90 fe af
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
fe a2 01 e0 90 fe ef 02 00:14:41.800 [VENDOR SPECIFIC]
fe a1 00 00 00 00 a0 02 00:14:41.800 [VENDOR SPECIFIC]
fe a6 50 60 4d 5b a2 02 00:14:41.600 [VENDOR SPECIFIC]
fe a6 50 60 4d 5b a2 02 00:14:41.400 [VENDOR SPECIFIC]
fe a6 50 60 4d 5b a2 02 00:14:41.100 [VENDOR SPECIFIC]
Error 511 occurred at disk power-on lifetime: 12734 hours (530 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 59 01 e3 4d cd e2 Error: UNC at LBA = 0x02cd4de3 = 47009251
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
20 00 01 e3 4d cd e2 02 7d+19:18:24.500 READ SECTOR(S)
20 00 01 e2 4d cd e2 02 7d+19:18:24.500 READ SECTOR(S)
20 00 01 e1 4d cd e2 02 7d+19:18:24.500 READ SECTOR(S)
20 00 01 e0 4d cd e2 02 7d+19:18:24.500 READ SECTOR(S)
20 00 01 df 4d cd e2 02 7d+19:18:24.500 READ SECTOR(S)
Error 510 occurred at disk power-on lifetime: 12734 hours (530 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 1d e3 4d cd e2 Error: UNC at LBA = 0x02cd4de3 = 47009251
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
40 00 40 c0 4d cd e2 02 7d+19:18:19.300 READ VERIFY SECTOR(S)
40 00 40 80 4d cd e2 02 7d+19:18:19.300 READ VERIFY SECTOR(S)
40 00 40 40 4d cd e2 02 7d+19:18:19.300 READ VERIFY SECTOR(S)
40 00 40 00 4d cd e2 02 7d+19:18:19.300 READ VERIFY SECTOR(S)
40 00 40 c0 4c cd e2 02 7d+19:18:19.300 READ VERIFY SECTOR(S)
Error 509 occurred at disk power-on lifetime: 12734 hours (530 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 59 01 00 8c a5 e2 Error: AMNF at LBA = 0x02a58c00 = 44403712
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
20 00 01 00 8c a5 e2 02 7d+19:17:33.300 READ SECTOR(S)
40 00 40 00 8c a5 a0 04 7d+19:17:33.300 READ VERIFY SECTOR(S)
40 00 40 00 8c a5 e2 02 7d+19:17:27.900 READ VERIFY SECTOR(S)
fa ac 00 00 00 00 a0 02 7d+19:17:27.900 [VENDOR SPECIFIC]
fb ac 00 00 00 00 a0 02 7d+19:17:27.900 [VENDOR SPECIFIC]
Error 508 occurred at disk power-on lifetime: 12734 hours (530 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 40 00 8c a5 e2 Error: AMNF at LBA = 0x02a58c00 = 44403712
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
40 00 40 00 8c a5 e2 02 7d+19:17:27.900 READ VERIFY SECTOR(S)
fa ac 00 00 00 00 a0 02 7d+19:17:27.900 [VENDOR SPECIFIC]
fb ac 00 00 00 00 a0 02 7d+19:17:27.900 [VENDOR SPECIFIC]
20 00 01 ff 8b a5 a0 04 7d+19:17:27.900 READ SECTOR(S)
20 00 01 ff 8b a5 e2 02 7d+19:17:22.700 READ SECTOR(S)
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 12748 -
# 2 Short offline Completed without error 00% 12734 -
Device does not support Selective Self Tests/Logging